Fully Automatic Trace Metal Contaminant Recovery Device 'NAC-316'
It has a fully automatic startup function for ICP-MS.
The "NAC-316" is a fully automated trace metal contaminant recovery device with bulk etching capabilities for Si wafers. Even beginners can obtain analytical results with ICP-MS. Additionally, it has two load ports, significantly improving work efficiency, and inline connection (OHT) is also possible. 【Features】 ■ Capable of recovering both hydrophilic wafers and hydrophobic wafers ■ Automatically performs bulk etching, recovery, and analysis on wafers set in the load port ■ Bulk etching is possible in two sizes: 200mm and 300mm ■ Bulk etching can also be performed in multiple layers on a single wafer, etc. *For more details, please download the PDF or contact us.
- Company:NAS技研
- Price:Other